- Excitation using Ar-Ne laser or wight ligth + monochromator
- Detection of the reflected or transmitted intensity
- Wavelength interval 0.2-0.8 µm

- Illumination: Halogen or deuterium lamp + monochromator
- Wavelength interval: 0.2 - 1.0 µm
- Detection of the transmitted intensity using secondary electron multiplier

- Illumination: wight light source + adjustable monochromator
- Four-circle goniometer for specimen positioning
- Semiconductor detector
- Application: Colloidal crystals

- Measurement in transmission or reflection
- Post-specimen monochromator

- Measurement in transmission or in reflection

- 2-point and 4-point measurements
- Tip positioning using micromanipulators (type: PH100)
- Electronic control and data acquisition
- Measurements possible also with light irradiation (integrated sun simulator)

- Xenon arc lamp, 150 W, ozone-free
- Radiation intensity: 1 - 2 suns
- Collimated beam diameter: 35 mm
- Filter: AM 1.5 global, 48°

- Measurement of the spreading resistance using an angled polish
- 2-point method
- Electrical conductivity depth profiling of layered semiconductor systems