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Scanning Force Microscope (AFM) Show image information
Ellipsometer for surface characterization Show image information
Ultra-high vacuum system for sample preparation and characterization Show image information
High resolution scanning electron microscope Show image information
Transmission electron microscope Show image information

Materials Science

Scanning Force Microscope (AFM)

Photo: Paderborn University

Materials Science

Ellipsometer for surface characterization

Photo: Paderborn University

Materials Science

Ultra-high vacuum system for sample preparation and characterization

Photo: Paderborn University

Materials Science

High resolution scanning electron microscope

Photo: Paderborn University

Materials Science

Transmission electron microscope

Photo: Paderborn University

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