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Δ Light microscopy
Δ Scanning electron microscopy (SEM)
Δ Transmission and scanning transmission electron microscopy (TEM,STEM, SAED, HRTEM, EFTEM)
Δ Scanning probe microscopy (SPM)
Δ Atomic force, scanning tunneling and magnetic force microscopy
Δ Microreflectometry
Δ Nanomask analysis

Δ Spectroscopy in the electron microscope
  - Energy-dispersive X-ray spectroscopy (EDXS)
  - Electron Energy-Loss Spectroscopy (EELS) 
Δ Photoemission spectroscopy (XPS/ESCA)
Δ Spectral response of solar cells
Δ Fourier transform infrared spectroscopy (FTIR)
Δ Photoluminescence spectroscopy (PL)
Δ Electron spin resonance (ESR)
Δ Optically detected electron spin resonance (ODMR)
Δ Optical and electrical surface analysis

Figure 2: TEM selected area diffraction pattern of a nanocrystalline alloy

Photonic materials

Different materials are analyzed, which are relevant for modern applications in optoelectronics and photonics:

Δ Perovskite nanocrystals
Δ Heteroepitaxial structures (SiC/Si, GaN/SiC, GaAs/InAs)
Δ SiC nanowires and composites
Δ ZnO nanowires
Δ Lattice defects in Si, GaN, GaAs
Δ Doped LiNbO3
Δ Plasmonic structures
Δ Left-hand materials

Figure 3: Nanohole-patterned SiC

Prof. Dr. Jörg Lindner

Nanopatterning - Nanoanalysis - Photonic Materials


Jörg Lindner
+49 5251 60-2748
+49 5251 60-3247

The University for the Information Society